Product advantages:

• • Wide application range

   Used for 4-8 inch original wafer, substrate and epitaxial wafer of various materials and polishing conditions

• • High measurement accuracy

  Thickness range: 0-1mm measurement accuracy: ± 1 μ M repetition accuracy: 0.2 μ m 

• • Short measurement time

   Measurement time: 30s / PCS (according to the customer's detection trajectory)

Sample display:

Sample 1

Sample 2

Sample 3